Sharma, Mithun, Sahni, Sanjeev P. and Sharma, Shilpi (2019) Reduction of defects in the lapping process of the silicon wafer manufacturing: the six sigma application. Engineering Management in Production and Services, 11 (2). pp. 87-105. De Gruyter Open Ltd . ISSN 25436597 Available at: https://doi.org/10.2478/emj-2019-0013

Sharma, Mithun, Sahni, Sanjeev P. and Sharma, Shilpi (2019) Validating a destructive measurement system using Gauge R&R: A case study. Engineering Management in Production and Services, 11 (4). pp. 34- 42. Walter de Gruyter . ISSN 25436597 Available at: https://doi.org/10.2478/emj-2019-0031