Nedumpara, James J. and Gyanchandani, Vandana (2013) China – definitive anti-dumping duties on X-Ray security inspection equipment from the European Union dispute analysis. Project Report. Indian Institute of Foreign Trade, New Delhi.
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Abstract
The paper contains dispute analysis of the Panel Report on China – Definitive Anti-Dumping Duties on X-Ray security inspection equipment from the European Union.
| Item Type: | Monograph (Project Report) |
|---|---|
| Keywords: | dispute report | China-x-ray |
| Subjects: | Social Sciences and humanities > Social Sciences > International Relations |
| JGU School/Centre: | Jindal Global Law School |
| Depositing User: | Arjun Dinesh |
| Date Deposited: | 18 May 2022 13:00 |
| Last Modified: | 18 May 2022 13:00 |
| Official URL: | http://wtocentre.iift.ac.in/DisputeAnalysis/Disput... |
| URI: | https://pure.jgu.edu.in/id/eprint/3138 |
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