Request a copy

Dey, Apurva, Kaushik, Arun Kumar and Pal, Rupayan (2020) Probabilistic patents, alternative damage rules, and optimal tariffs. Journal of Institutional and Theoretical Economics, 176 (2). pp. 276-311. ISSN 9324569
[thumbnail of JOITE 2020.pdf] Text
JOITE 2020.pdf - Published Version
Restricted to Repository staff only

320kB
Required Email address
+
-
Enter your email address.
Reason
+
-
You may enter a rationale for requesting this document.